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United States. National Bureau of Standards. Special public ...
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1

Building technology publications:

Beavers, Linda ; United States. National Bureau of Standards. Special publication ; Center for Building Technology
http://hdl.handle.net/2027/mdp.39015077586793.  , 1983
Link: http://hdl.handle.net/20..
 
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2

Laser induced damage in optical materials, 1981 : proceedin..:

Bennett, Harold Earl, 1929- ; United States. National Bureau of Standards. Special Publication ; Symposium on Optical Materials for High Power Lasers (13th : 1981 : Boulder, Colo.)
http://hdl.handle.net/2027/mdp.39015086578039.  , 1983
Link: http://hdl.handle.net/20..
 
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3

Future information processing technology-1983:

Powell, Patricia B ; Kay, Peg ; United States. National Bureau of Standards. Special publication..
http://hdl.handle.net/2027/mdp.39015077587767.  , 1983
Link: http://hdl.handle.net/20..
 
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4

A manual wafer probe station for an integrated circuit test..:

Carver, G. P ; Cullins, W. A ; United States. National Bureau of Standards. Special publication.
http://hdl.handle.net/2027/mdp.39015077586017.  , 1981
Link: http://hdl.handle.net/20..
 
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5

The Relationship between resistivity and dopant density for..:

Filliben, J. J ; Liu, Y. M ; Mattis, R. L..
http://hdl.handle.net/2027/mdp.39015077585993.  , 1981
Link: http://hdl.handle.net/20..
 
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6

Validation, verification, and testing of computer software:

Adrion, W. Richards ; Cherniavsky, John C ; Branstad, Martha A...
http://hdl.handle.net/2027/mdp.39015077587734.  , 1981
Link: http://hdl.handle.net/20..
 
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7

Database architectures, a feasibility workshop report:

Whitney, Kevin. edt ; Graham, Marc. edt ; Berg, John L. edt..
http://hdl.handle.net/2027/mdp.39015077587742.  , 1981
Link: http://hdl.handle.net/20..
 
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8

Test patterns NBS-28 and NBS-28A : random fault interconnec..:

Mitchell, Michael A ; Linholm, Loren W ; United States. National Bureau of Standards. Special publication..
http://hdl.handle.net/2027/mdp.39015077586009.  , 1981
Link: http://hdl.handle.net/20..
 
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9

NBS standard reference materials catalog 1981-83 edition:

United States. National Bureau of Standards. Special publication ; National Measurement Laboratory (U.S.). Office of Standard Reference Materials
http://hdl.handle.net/2027/mdp.39015077586637.  , 1981
Link: http://hdl.handle.net/20..
 
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10

Specifications and test methods for numeric accuracy in pro..:

Cugini, John V ; United States. National Bureau of Standards. Special publication ; Institute for Computer Sciences and Technology.
http://hdl.handle.net/2027/mdp.39015077587759.  , 1981
Link: http://hdl.handle.net/20..
 
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11

Features of software development tools:

Houghton, Raymond C. Jr ; United States. National Bureau of Standards. Special publication ; Institute for Computer Sciences and Technology.
http://hdl.handle.net/2027/mdp.39015077587700.  , 1981
Link: http://hdl.handle.net/20..
 
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12

Emergency vehicle warning systems:

Rubin, Arthur I ; Howett, Gerald Leonard, 1931- ; United States. National Bureau of Standards. Special publication...
http://hdl.handle.net/2027/mdp.39015077584996.  , 1981
Link: http://hdl.handle.net/20..
 
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13

Eddy current nondestructive testing : proceedings of the Wo..:

Workshop on Eddy Current Nondestructive Testing (1977 : National Bureau of Standards) ; Free, George M. edt ; United States. National Bureau of Standards. Special publication.
http://hdl.handle.net/2027/mdp.39015086414136.  , 1981
Link: http://hdl.handle.net/20..
 
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14

Computer model documentation guide:

United States. National Bureau of Standards. Special publication ; Center for Programming Science and Technology (Institute for Computer Sciences and Technology) ; Federal Computer Performance Evaluation and Simulation Center (U.S.)
http://hdl.handle.net/2027/mdp.39015077587718.  , 1981
Link: http://hdl.handle.net/20..
 
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15

Accuracy in powder diffraction : proceedings of a Symposium..:

Symposium on Accuracy in Powder Diffraction (1979 : National Bureau of Standards) ; Hubbard, C. R ; Block, Stanley...
http://hdl.handle.net/2027/mdp.39015077587940.  , 1980
Link: http://hdl.handle.net/20..
 
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