Vachon, Frederic
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Wafer-Level Characterization and Monitoring Platform for Si..:

Parent, Samuel ; Vachon, Frédéric ; Gauthier, Valérie...
IEEE Journal of the Electron Devices Society.  12 (2024)  - p. 127-137 , 2024
 
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4

Characterization and Monitoring Platform for Single-Photon ..:

, In: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS),
 
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