Valiantzas, Dimitris
3  results:
Search for persons X
?
1

Towards a Comprehensive SET Analysis Flow for VLSI Circuits..:

, In: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
 
?
2

Simulation-Based Maximum Coverage Hazard Detection and Elim..:

, In: 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC),
 
?
3

STA for Mixed Cyclic, Acyclic Circuits:

, In: 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI),
 
1-3