E-LIB Suche - Ergebnisse für: Vandemaele, M.

1

Exploiting Bias Temperature Instability for Reservoir Compu..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Guo, Y. ; Degraeve, R. ; Vandemaele, M.... - p. 1-7 , 2024

Link: https://doi.org/10.1109/..

2

Reliability challenges in Forksheet Devices: (Invited Paper:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),

Bury, E. ; Vandemaele, M. ; Franco, J.... - p. 1-8 , 2023

Link: https://doi.org/10.1109/..

3

Trapping of Hot Carriers in the Forksheet FET Wall: A TCAD ..:

Vandemaele, M. ; Kaczer, B. ; Tyaginov, S....
IEEE Electron Device Letters. 44 (2023) 2 - p. 197-200 , 2023

Link: https://doi.org/10.1109/..

4

On The Contribution of Secondary Holes in Hot-Carrier Degra..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),

Tyaginov, S.E. ; Bury, E. ; Grill, A.... - p. 1-3 , 2023

Link: https://doi.org/10.1109/..

5

OC-0756 A first step towards value-based healthcare in radi..:

Vandemaele, M. ; Aggarwal, A. ; Lievens, Y.
Radiotherapy and Oncology. 182 (2023) - p. S622-S623 , 2023

Link: https://doi.org/10.1016/..

6

PO-1620 Can auto-delineated lung lobe motion be a surrogate..:

Bogaert, E. ; Johnston, N. ; Huybrechts, V....
Radiotherapy and Oncology. 170 (2022) - p. S1409-S1410 , 2022

Link: https://doi.org/10.1016/..

7

Dedicated ICs for the Characterization of Variability and A..:

, In: 2022 IEEE Latin American Electron Devices Conference (LAEDC),

Diaz-Fortuny, J. ; Saraza-Canflanca, P. ; Vandemaele, M.... - p. 1-4 , 2022

Link: https://doi.org/10.1109/..

8

The impact of self-heating and its implications on hot-carr..:

Tyaginov, S. ; Makarov, A. ; Chasin, A....
Microelectronics Reliability. 122 (2021) - p. 114156 , 2021

Link: https://doi.org/10.1016/..

9

A BSIM-Based Predictive Hot-Carrier Aging Compact Model:

, In: 2021 IEEE International Reliability Physics Symposium (IRPS),

Xiang, Y. ; Tyaginov, S. ; Vandemaele, M.... - p. 1-9 , 2021

Link: https://doi.org/10.1109/..

10

Physical Modeling the Impact of Self-Heating on Hot-Carrier..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),

Tyaginov, S. ; Makarov, A. ; Chasin, A.... - p. 1-7 , 2020

Link: https://doi.org/10.1109/..

11

Understanding and Physical Modeling Superior Hot-Carrier Re..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),

Tyaginov, S. ; Grill, A. ; De Keersgieter, A.... - p. 21.3.1-21.3.4 , 2019

Link: https://doi.org/10.1109/..

12

Cramer type large deviations for studentized U-statistics:

Vandemaele, M. ; Veraverbeke, N.
Metrika. 32 (1985) 1 - p. 165-179 , 1985

Link: https://doi.org/10.1007/..

13

Cramer Type Large Deviations for Studentized U-Statistics:

Vandemaele, M. ; Veraverbeke, M.
Metrika. 32 (1985) - p. , 1985

Link: http://www.digizeitschri..

14

On Large Deviation Probabilities for U-Statistics:

Vandemaele, M.
Theory of Probability & Its Applications. 27 (1983) 3 - p. 614-614 , 1983

Link: https://doi.org/10.1137/..

15

A cramer type large deviation theorem for trimmed linear co..:

Callaert, H. ; Vandemaele, M. ; Veraverbeke, N.
Communications in Statistics - Theory and Methods. 11 (1982) 23 - p. 2689-2698 , 1982

Link: https://doi.org/10.1080/..