E-LIB Suche - Ergebnisse für: Vandervorst, W.

1

Orbitrap™-SIMS analysis of advanced semiconductor inorganic..:

Franquet, A. ; Spampinato, V. ; Kayser, S...
Vacuum. 202 (2022) - p. 111182 , 2022

Link: https://doi.org/10.1016/..

2

Linearized radially polarized light for improved precision ..:

Prabhakara, V. ; Nuytten, T. ; Bender, H....
Optics Express. 29 (2021) 21 - p. 34531 , 2021

Link: https://doi.org/10.1364/..

3

Epitaxial Growth of (Si)GeSn Source/Drain Layers for Advanc..:

, In: 2019 Compound Semiconductor Week (CSW),

Loo, R. ; Vohra, A. ; Porret, C.... - p. 1-2 , 2019

Link: https://doi.org/10.1109/..

4

High-sensitivity Rutherford backscattering spectrometry emp..:

Laricchiuta, G. ; Vandervorst, W. ; Meersschaut, J.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 439 (2019) - p. 59-63 , 2019

Link: https://doi.org/10.1016/..

5

Chemical vapor deposition of monolayer-thin WS2 crystals fr..:

Groven, B. ; Claes, D. ; Nalin Mehta, A....
The Journal of Chemical Physics. 150 (2019) 10 - p. , 2019

Link: https://doi.org/10.1063/..

6

Reverse tip sample scanning for precise and high-throughput..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),

Celano, U. ; Hantschel, T. ; Boehme, T.... - p. 5.1.1-5.1.4 , 2019

Link: https://doi.org/10.1109/..

7

Nanoscale Localization of an Atom Probe Tip through Electri..:

Op de Beeck, Jonathan ; Fleischmann, C. ; Vandervorst, W..
The Journal of Physical Chemistry C. 124 (2019) 11 - p. 6371-6378 , 2019

Link: https://doi.org/10.1021/..

8

Wet-chemical etching of atom probe tips for artefact free a..:

Melkonyan, D. ; Fleischmann, C. ; Veloso, A....
Ultramicroscopy. 186 (2018) - p. 1-8 , 2018

Link: https://doi.org/10.1016/..

9

Atom probe tomography for advanced nanoelectronic devices: ..:

Barnes, J.P. ; Grenier, A. ; Mouton, I....
Scripta Materialia. 148 (2018) - p. 91-97 , 2018

Link: https://doi.org/10.1016/..

10

Inorganic material profiling using Arn+ cluster: Can we ach..:

Conard, T. ; Fleischmann, C. ; Havelund, R....
Applied Surface Science. 444 (2018) - p. 633-641 , 2018

Link: https://doi.org/10.1016/..

11

Measurement of the apex temperature of a nanoscale semicond..:

Kumar, A. ; Bogdanowicz, J. ; Demeulemeester, J....
Journal of Applied Physics. 124 (2018) 24 - p. , 2018

Link: https://doi.org/10.1063/..

12

Laser-assisted atom probe tomography of semiconductors: The..:

Bogdanowicz, J. ; Kumar, A. ; Fleischmann, C....
Ultramicroscopy. 188 (2018) - p. 19-23 , 2018

Link: https://doi.org/10.1016/..

13

Atom probe tomography analysis of SiGe fins embedded in SiO..:

Melkonyan, D. ; Fleischmann, C. ; Arnoldi, L....
Ultramicroscopy. 179 (2017) - p. 100-107 , 2017

Link: https://doi.org/10.1016/..

14

Calibration of PIXE yields using Cu as a reference:

Harayama, I. ; Sekiba, D. ; Zhao, Q....
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 406 (2017) - p. 115-118 , 2017

Link: https://doi.org/10.1016/..

15

X-ray absorption in pillar shaped transmission electron mic..:

Bender, H. ; Seidel, F. ; Favia, P...
Ultramicroscopy. 177 (2017) - p. 58-68 , 2017

Link: https://doi.org/10.1016/..