Vanhove, N.
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1

Correlative Microscopy Using SIMS For High-Sensitivity Elem..:

Wirtz, T. ; Dowsett, D. ; Vanhove, N..
Microscopy and Microanalysis.  19 (2013)  S2 - p. 356-357 , 2013
 
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2

Towards SIMS on the Helium Ion Microscope: Detection Limits..:

Dowsett, D. ; Pillatsch, L. ; Vanhove, N....
Microscopy and Microanalysis.  19 (2013)  S2 - p. 354-355 , 2013
 
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5

Towards Secondary Ion Mass Spectrometry On The Helium Ion M..:

Wirtz, T. ; Pillatsch, L. ; Vanhove, N....
Microscopy and Microanalysis.  18 (2012)  S2 - p. 812-813 , 2012
 
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6

Zero‐energy SIMS depth profiling: the role of surface rough..:

Vanhove, N. ; Lievens, P. ; Vandervorst, W.
Surface and Interface Analysis.  43 (2011)  1-2 - p. 159-162 , 2011
 
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9

ITON Schottky contacts for GaN based UV photodetectors:

Vanhove, N. ; John, J. ; Lorenz, A....
Applied Surface Science.  253 (2006)  5 - p. 2930-2932 , 2006
 
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11

Regional economic development policy:

Vanhove, N.
Cities.  1 (1984)  3 - p. 296 , 1984
 
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12

Tourism and employment:

Vanhove, N.
International Journal of Tourism Management.  2 (1981)  3 - p. 162-175 , 1981
 
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13

Forecasting in tourism:

Vanhove, N.
The Tourist Review.  35 (1980)  3 - p. 2-7 , 1980
 
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14

Coastal belt tourism, economic development and environmenta..:

Haulot, A. ; Vanhove, N. ; Verheyden, L. R. A..
International Journal of Environmental Studies.  10 (1977)  2 - p. 161-172 , 1977
 
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15

The holiday expenses of the Belgian population 

, In: Jahrbuch für Fremdenverkehr
some econometric considerations 
Vanhove, N.. (1969)  - p. 42-63
 
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