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Vayrette, Renaud
18
results:
Search for persons
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Format
Online (18)
Mediatypes
Articles (Online) (5)
OpenAccess-fulltext (13)
Languages
english (13)
french (4)
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?
1
Raman analysis of strain in p-type doped silicon nanostruct..:
Ureña-Begara, Ferran
;
Vayrette, Renaud
;
Bhaskar, Umesh Kumar
.
Journal of Applied Physics. 124 (2018) 9 - p. , 2018
Link:
https://doi.org/10.1063/..
?
2
On-chip fracture testing of freestanding nanoscale material:
Vayrette, Renaud
;
Raskin, Jean-Pierre
;
Pardoen, Thomas
Engineering Fracture Mechanics. 150 (2015) - p. 222-238 , 2015
Link:
https://doi.org/10.1016/..
?
3
On-Chip MEMS-Based Internal Stress Actuated Structures for ..:
Vayrette, Renaud
;
Coulombier, Michael
;
Pardoen, Thomas
.
Advanced Materials Research. 996 (2014) - p. 833-840 , 2014
Link:
https://doi.org/10.4028/..
?
4
Multiscale modelling framework for the fracture of thin bri..:
Mulay, Shantanu S.
;
Becker, Gauthier
;
Vayrette, Renaud
...
Computational Mechanics. 55 (2014) 1 - p. 73-91 , 2014
Link:
https://doi.org/10.1007/..
?
5
X-ray microbeam strain investigation on Cu–MEMS structures:
Perroud, Olivier
;
Vayrette, Renaud
;
Rivero, Christian
...
Microelectronic Engineering. 87 (2010) 3 - p. 394-397 , 2010
Link:
https://doi.org/10.1016/..
?
6
Raman analysis of strain in p-type doped silicon nanostruct..:
Ureña Begara, Fernando
;
Vayrette, Renaud
;
Bhaskar, Umesh Kumar
.
boreal:229230. , 2018
Link:
http://hdl.handle.net/20..
?
7
Raman analysis of strain in p-type doped silicon nanostruct..:
Ureña Begara, Fernando
;
Vayrette, Renaud
;
Bhaskar, Umesh Kumar
.
boreal:229230. , 2018
Link:
http://hdl.handle.net/20..
?
8
Fracture mechanisms in freestanding polycrystalline silicon..:
Vayrette, Renaud
;
Galceran, M
;
Coulombier, Michaël
...
boreal:187227. , 2016
Link:
http://hdl.handle.net/20..
?
9
Fracture mechanisms in freestanding polycrystalline silicon..:
Vayrette, Renaud
;
Galceran, M
;
Coulombier, Michaël
...
boreal:187227. , 2016
Link:
http://hdl.handle.net/20..
?
10
Multiscale modelling framework for the fracture of thin bri..:
Mulay, Shantanu
;
Becker, Gauthier
;
Vayrette, Renaud
...
http://dx.doi.org/10.1007/s00466-014-1083-4. , 2015
Link:
https://orbi.uliege.be/h..
?
11
On-chip MEMS-based internal stress actuated structures for ..:
Vayrette, Renaud
;
Coulombier, Michaël
;
Pardoen, Thomas
.
boreal:187257. , 2014
Link:
http://hdl.handle.net/20..
?
12
On-chip MEMS-based internal stress actuated structures for ..:
Vayrette, Renaud
;
Coulombier, Michaël
;
Pardoen, Thomas
.
boreal:187257. , 2014
Link:
http://hdl.handle.net/20..
?
13
Bauschinger effect in thin metallic films by fem simulation:
Marandi, Kianoosh
;
Vayrette, Renaud
;
Pardoen, Thomas
..
978-84-941531-5-0. , 2013
Link:
http://hdl.handle.net/21..
?
14
The fracture studies of polycrystalline silicon based MEMS:
Mulay, Shantanu Shashikant
;
Becker, Gauthier
;
Vayrette, Renaud
...
https://orbi.uliege.be/handle/2268/151957. , 2012
Link:
https://orbi.uliege.be/h..
?
15
Mechanical stress and resistivity analysis of the integrate..:
Vayrette, Renaud
NNT: 2011EMSE0599. , 2011
Link:
https://tel.archives-ouv..
1-15