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Veinberg Vidal, Elias
22  results:
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1

Understanding and monitoring the capacitance‐voltage techni..:

Leon, Cyril ; Le Gall, Sylvain ; Gueunier‐Farret, Marie‐Estelle...
Progress in Photovoltaics: Research and Applications.  28 (2020)  6 - p. 601-608 , 2020
Link: https://doi.org/10.1002/..
 
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2

Electrons irradiation of III-V//Si solar cells for NIRT con..:

Medjoubi, Karim ; Lefèvre, Jérémie ; Vauche, Laura...
Solar Energy Materials and Solar Cells.  223 (2021)  - p. 110975 , 2021
Link: https://doi.org/10.1016/..
 
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3

In-Situ Measurement of the Effect of 1-MeV Electrons Irradi..:

, In: 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC),
Medjoubi, Karim ; Cariou, Romain ; Vauche, Laura... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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4

Understanding and monitoring the capacitance‐voltage techni..:

Léon, Cyril ; Le Gall, Sylvain ; Gueunier-Farret, Marie-Estelle...
info:eu-repo/semantics/altIdentifier/doi/10.1002/pip.3235.  , 2020
Link: https://hal.science/hal-..
 
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5

Understanding and monitoring the capacitance‐voltage techni..:

Léon, Cyril ; Le Gall, Sylvain ; Gueunier-Farret, Marie-Estelle...
info:eu-repo/semantics/altIdentifier/doi/10.1002/pip.3235.  , 2020
Link: https://hal.science/hal-..
 
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6

Understanding and monitoring the capacitance‐voltage techni..:

Léon, Cyril ; Le Gall, Sylvain ; Gueunier-Farret, Marie-Estelle...
info:eu-repo/semantics/altIdentifier/doi/10.1002/pip.3235.  , 2020
Link: https://hal.science/hal-..
 
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7

Understanding and monitoring the capacitance‐voltage techni..:

Léon, Cyril ; Le Gall, Sylvain ; Gueunier-Farret, Marie-Estelle...
info:eu-repo/semantics/altIdentifier/doi/10.1002/pip.3235.  , 2020
Link: https://hal.science/hal-..
 
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8

Understanding and monitoring the capacitance‐voltage techni..:

Léon, Cyril ; Le Gall, Sylvain ; Gueunier-Farret, Marie-Estelle...
info:eu-repo/semantics/altIdentifier/doi/10.1002/pip.3235.  , 2020
Link: https://hal.archives-ouv..
 
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9

III-V on Si solar cells behavior at NIRT and LILT condition..:

, In: 2019 European Space Power Conference (ESPC),
Medjoubi, Karim ; Cariou, Romain ; Lefevre, Jeremie... - p. 1-7 , 2019
Link: https://doi.org/10.1109/..
 
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10

Capacitance-Voltage Characterization Technique Adapted to T..:

Léon, Cyril ; Le Gall, Sylvain ; Gueunier-Farret, Marie-Estelle...
info:eu-repo/semantics/altIdentifier/doi/10.4229/EUPVSEC20192019-3CO.8.3.  , 2019
Link: https://centralesupelec...
 
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11

Capacitance-Voltage Characterization Technique Adapted to T..:

Léon, Cyril ; Le Gall, Sylvain ; Gueunier-Farret, Marie-Estelle...
info:eu-repo/semantics/altIdentifier/doi/10.4229/EUPVSEC20192019-3CO.8.3.  , 2019
Link: https://hal-centralesupe..
 
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12

Capacitance-Voltage Characterization Technique Adapted to T..:

Léon, Cyril ; Le Gall, Sylvain ; Gueunier-Farret, Marie-Estelle...
info:eu-repo/semantics/altIdentifier/doi/10.4229/EUPVSEC20192019-3CO.8.3.  , 2019
Link: https://centralesupelec...
 
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13

Capacitance-Voltage Characterization Technique Adapted to T..:

Léon, Cyril ; Le Gall, Sylvain ; Gueunier-Farret, Marie-Estelle...
info:eu-repo/semantics/altIdentifier/doi/10.4229/EUPVSEC20192019-3CO.8.3.  , 2019
Link: https://centralesupelec...
 
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14

Fabrication, characterization and simulation of III-V on Si..:

Veinberg Vidal, Elias
NNT: 2018GREAT091.  , 2018
Link: https://theses.hal.scien..
 
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15

Fabrication, characterization and simulation of III-V on Si..:

Veinberg Vidal, Elias
NNT: 2018GREAT091.  , 2018
Link: https://theses.hal.scien..
 
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