E-LIB Suche - Ergebnisse für: Veit, Peter

1

An inclusive, empirically grounded inventory facilitates re..:

Qin, Siyu ; He, Yifan ; Golden Kroner, Rachel E....
One Earth. 7 (2024) 6 - p. 962-975 , 2024

Link: https://doi.org/10.1016/..

2

Origin of the parasitic luminescence of 235 nm UVC LEDs gro..:

Hagedorn, Sylvia ; Kolbe, Tim ; Schmidt, Gordon...
Applied Physics Letters. 124 (2024) 6 - p. , 2024

Link: https://doi.org/10.1063/..

3

Life Cycle Management für den Fahrweg der Eisenbahn: Von Da..:

, In: Agile Digitalisierung im Baubetrieb,

Veit, Peter - p. 665-682 , 2023

Link: https://doi.org/10.1007/..

4

Interaction of Catalysts for Unitized Regenerative Fuel Cel..:

Maletzko, Annabelle ; Gomez Villa, Eduardo Daniel ; Kintzel, Birgit...
ECS Transactions. 112 (2023) 4 - p. 185-197 , 2023

Link: https://doi.org/10.1149/..

5

Sputter Epitaxy of AlN and GaN on Si(111):

Dadgar, Armin ; Hörich, Florian ; Borgmann, Ralf...
physica status solidi (a). 220 (2022) 8 - p. , 2022

Link: https://doi.org/10.1002/..

6

Direct Imaging of the Carrier Capture into Individual InP Q..:

Bertram, Frank ; Schmidt, Gordon ; Kernchen, Julie...
ACS Nano. 16 (2022) 3 - p. 4619-4628 , 2022

Link: https://doi.org/10.1021/..

7

Sputter epitaxy of AlN and GaN on Si for device application:

, In: 2022 Compound Semiconductor Week (CSW),

Dadgar, Armin ; Horich, Florian ; Borgmann, Ralf... - p. 1-1 , 2022

Link: https://doi.org/10.1109/..

8

Eisenbahnbetriebswissenschaftliche Optimierung des Instandh..:

Jacke, Tobias , 2021

Link: https://nbn-resolving.de..

9

Community land formalization and company land acquisition p..:

Notess, Laura ; Veit, Peter ; Monterroso, Iliana...
Land Use Policy. 110 (2021) - p. 104461 , 2021

Link: https://doi.org/10.1016/..

10

Demonstration of lateral epitaxial growth of AlN on Si (1 1..:

Hörich, Florian ; Borgmann, Ralf ; Bläsing, Jürgen...
Journal of Crystal Growth. 571 (2021) - p. 126250 , 2021

Link: https://doi.org/10.1016/..

11

Data Sources and Research Models for Turnouts:

, In: Springer Series in Reliability Engineering; Intelligent Quality Assessment of Railway Switches and Crossings,

Wilfling, Petra A. ; Fellinger, Michael ; Veit, Peter - p. 109-127 , 2021

Link: https://doi.org/10.1007/..

12

Entwicklung eines materialunabhängigen Nachweisverfahrens ..:

Hoffmann, David Ingo , 2020

Link: http://nbn-resolving.de/..

13

Optical and Structural Properties of Nitride Based Nanostru..:

, In: Semiconductor Nanophotonics; Springer Series in Solid-State Sciences,

Bertram, Frank ; Berger, Christoph ; Christen, Jürgen... - p. 135-201 , 2020

Link: https://doi.org/10.1007/..

14

Analyzing Major Track Quality Indices and Introducing a Uni..:

Offenbacher, Stefan ; Neuhold, Johannes ; Veit, Peter.
Applied Sciences. 10 (2020) 23 - p. 8490 , 2020

Link: https://doi.org/10.3390/..

15

Printability and microstructural evolution of a near-eutect..:

Schmelzer, Janett ; Rittinghaus, Silja-Katharina ; Gruber, Karl...
Additive Manufacturing. 34 (2020) - p. 101208 , 2020

Link: https://doi.org/10.1016/..