E-LIB Suche - Ergebnisse für: Veksler, Dmitry

1

Ultra-fast switching memristors based on two-dimensional ma..:

Teja Nibhanupudi, S. S. ; Roy, Anupam ; Veksler, Dmitry...
Nature Communications. 15 (2024) 1 - p. , 2024

Link: https://doi.org/10.1038/..

2

Experimental demonstration of sub-nanosecond switching in 2..:

, In: 2022 Device Research Conference (DRC),

Nibhanupudi, SS Teja ; Veksler, Dmitry ; Roy, Anupam... - p. 1-2 , 2022

Link: https://doi.org/10.1109/..

3

(Invited) Towards the Physical Reliability of 3D-Integrated..:

Amoah, Papa K. ; Sunday, Christopher E ; Okoro, Chukwudi...
ECS Transactions. 109 (2022) 2 - p. 41-49 , 2022

Link: https://doi.org/10.1149/..

4

Ferroelectricity in Polar Polymer‐Based FETs: A Hysteresis ..:

Georgiou, Vasileia ; Veksler, Dmitry ; Campbell, Jason P....
Advanced Functional Materials. 28 (2018) 10 - p. , 2018

Link: https://doi.org/10.1002/..

5

Microwave Monitoring of Atmospheric Corrosion of Interconne..:

Amoah, Papa K. ; Veksler, Dmitry ; Sunday, Christopher E....
ECS Journal of Solid State Science and Technology. 7 (2018) 12 - p. N143-N149 , 2018

Link: https://doi.org/10.1149/..

6

Toward reliable RRAM performance: macro- and micro-analysis..:

Bersuker, Gennadi ; Veksler, Dmitry ; Nminibapiel, David M....
Journal of Computational Electronics. 16 (2017) 4 - p. 1085-1094 , 2017

Link: https://doi.org/10.1007/..

7

(Invited) Understanding the Pre-Failure Thermo-Mechanical I..:

Sunday, Christopher E ; Veksler, Dmitry ; Cheung, K. P..
ECS Transactions. 77 (2017) 2 - p. 71-77 , 2017

Link: https://doi.org/10.1149/..

8

(Invited) Devices in Advanced Technology Nodes: Application..:

Bersuker, Gennadi ; Pierce, Donald G. ; Veksler, Dmitry.
ECS Transactions. 79 (2017) 1 - p. 99-118 , 2017

Link: https://doi.org/10.1149/..

9

Microwave evaluation of electromigration susceptibility in ..:

Sunday, Christopher E. ; Veksler, Dmitry ; Cheung, Kin C..
Journal of Applied Physics. 122 (2017) 17 - p. , 2017

Link: https://doi.org/10.1063/..

10

Highly Efficient Rapid Annealing of Thin Polar Polymer Film..:

Georgiou, Vasileia ; Veksler, Dmitry ; Ryan, Jason T....
Advanced Functional Materials. 28 (2017) 8 - p. , 2017

Link: https://doi.org/10.1002/..

11

Evaluation of variability and RTN in scaled RRAM:

, In: 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW),

Veksler, Dmitry ; Bersuker, G. ; Butcher, B.... - p. 52-52 , 2014

Link: https://doi.org/10.1109/..

12

Interface trap density and mobility extraction in InGaAs bu..:

Chidambaram, Thenappan ; Veksler, Dmitry ; Madisetti, Shailesh...
Applied Physics Letters. 104 (2014) 13 - p. , 2014

Link: https://doi.org/10.1063/..

13

(Invited) Passivation Schemes for Ge High-K Metal Gate MOSF..:

Tapily, Kandabara ; Ngai, Tat ; Clark, Robert...
ECS Transactions. 61 (2014) 2 - p. 89-96 , 2014

Link: https://doi.org/10.1149/..

14

Gate dielectric degradation: Pre-existing vs. generated def..:

Veksler, Dmitry ; Bersuker, Gennadi
Journal of Applied Physics. 115 (2014) 3 - p. , 2014

Link: https://doi.org/10.1063/..

15

Electron Scattering in Buried InGaAs/High-k MOS Channels:

Oktyabrsky, Serge ; Veksler, Dmitry ; Nagaiah, Padmaja...
ECS Transactions. 35 (2011) 3 - p. 385-395 , 2011

Link: https://doi.org/10.1149/..