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Velardia, F.
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Reliability of Medium Blocking Voltage Power VDMOSFET in Ra..:

Velardia, F. ; Iannuzzo, F. ; Busatto, G....
Microelectronics Reliability.  43 (2003)  9-11 - p. 1847-1851 , 2003
Link: https://doi.org/10.1016/..
 
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The Reliability of New Generation Power MOSFETs in Radiatio..:

Velardia, F. ; Iannuzzoa, F. ; Busattoa, G...
Microelectronics Reliability.  42 (2002)  9-11 - p. 1629-1634 , 2002
Link: https://doi.org/10.1016/..
 
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