I agree that this site is using cookies. You can find further informations here.
X
Veloso, A.
19460  results:
Search for persons X
?
1

CMOS Scaling by Nanosheet Device Architectures and Backside..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Horiguchi, N. ; Mertens, H. ; Ritzenthaler, R.... - p. 1-2 , 2024
Link: https://doi.org/10.1109/..
 
?
2

Cherenkov Light Emission in Pure Cherenkov Emitters for Pro..:

Rebolo, L. ; Trigila, C. ; Ellin, J....
IEEE Transactions on Radiation and Plasma Medical Sciences.  8 (2024)  1 - p. 15-20 , 2024
Link: https://doi.org/10.1109/..
 
?
3

3D Stacked Devices and MOL Innovations for Post-Nanosheet C..:

, In: 2023 International Electron Devices Meeting (IEDM),
Horiguchi, N. ; Mertens, H. ; Chiarella, T.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
?
4

Impact of Backside Power Delivery Network with Buried Power..:

, In: 2023 45th Annual EOS/ESD Symposium (EOS/ESD),
Serbulova, K. ; Chen, S.-H. ; Hellings, G.... - p. 1-6 , 2023
Link: https://doi.org/10.23919..
 
?
5

PPA and Scaling Potential of Backside Power Options in N2 a..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Yang, S. ; Schuddinck, P. ; Garcia-Bardon, M.... - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
?
6

Nanosheet-based Device Architectures with Front/Backside Co..:

, In: 2023 21st International Workshop on Junction Technology (IWJT),
Veloso, A. ; Eneman, G. ; Matagne, P.... - p. 1-5 , 2023
Link: https://doi.org/10.23919..
 
?
7

In-depth static and low frequency noise assessment of p-cha..:

Cretu, B. ; Veloso, A. ; Simoen, E.
Solid-State Electronics.  201 (2023)  - p. 108591 , 2023
Link: https://doi.org/10.1016/..
 
?
8

Backside Power Delivery: Game Changer and Key Enabler of Ad..:

, In: 2023 International Electron Devices Meeting (IEDM),
Veloso, A. ; Vermeersch, B. ; Chen, R.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
?
9

Corrigendum to "In-depth static and low frequency noise ass..:

Cretu, B. ; Veloso, A. ; Simoen, E.
Solid-State Electronics.  207 (2023)  - p. 108666 , 2023
Link: https://doi.org/10.1016/..
 
?
10

Evaluation of n-type gate-all-around vertically-stacked nan..:

Silva, V.C.P. ; Martino, J.A. ; Simoen, E...
Solid-State Electronics.  208 (2023)  - p. 108729 , 2023
Link: https://doi.org/10.1016/..
 
?
11

Structural effects induced by dialysis-based purification o..:

Veloso, A.D. ; Ferraria, A.M. ; Botelho do Rego, A.M....
Nano Materials Science.  , 2023
Link: https://doi.org/10.1016/..
 
?
12

Is there a limit when the access resistance impact on the e..:

Tahiat, A. ; Cretu, B. ; Veloso, A..
Solid-State Electronics.  209 (2023)  - p. 108711 , 2023
Link: https://doi.org/10.1016/..
 
?
13

Novel Y-function based strategy for parameter extraction in..:

Tahiat, A. ; Cretu, B. ; Veloso, A..
Solid-State Electronics.  209 (2023)  - p. 108709 , 2023
Link: https://doi.org/10.1016/..
 
?
14

ESD Challenges in 300nm Si Substrate of DTCO/STCO Scaling O..:

, In: 2023 International Electron Devices Meeting (IEDM),
Chen, W.-C. ; Chen, S.-H. ; Veloso, A.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
?
15

Block-level Evaluation and Optimization of Backside PDN for..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Sisto, G. ; Preston, R. ; Chen, R.... - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
1-15