E-LIB Suche - Ergebnisse für: Vexler, Robert I.

1

Dwight D. Eisenhower

1890 - 1969; chronology, documents, bibliographical aids Presidential chronology series

Vexler, Robert I. ; Eisenhower, Dwight David , 1970

Copies: Zentrale:E03 a hit 617 nb/670

2

"Small Blood Vessels: Big Health Problems?": Scientific Rec..:

Bosetti, Francesca ; Galis, Zorina S ; Bynoe, Margaret S...
qt0vr4p6wx. , 2016

Link: https://escholarship.org..

3

"Small Blood Vessels: Big Health Problems?": Scientific Rec..:

Bosetti, Francesca ; Galis, Zorina S ; Bynoe, Margaret S...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC5210346/. , 2016

Link: http://www.ncbi.nlm.nih...

4

Variability and high temperature reliability of graphene fi..:

Illarionov, Yu. Yu. ; Knobloch, T. ; Uzlu, B....
npj 2D Materials and Applications. 8 (2024) 1 - p. , 2024

Link: https://doi.org/10.1038/..

5

Calcium Fluoride Films with 2–10 nm Thickness on Silicon-(1..:

Banshchikov, A. G. ; Vexler, M. I. ; Ivanov, I. A....
Semiconductors. 57 (2023) 4 - p. 211-215 , 2023

Link: https://doi.org/10.1134/..

6

Effect of fluoride layer thickness on the leakage current i..:

Banshchikov, A.G. ; Dvortsova, P.A. ; Illarionov, Yu.Yu....
Thin Solid Films. 783 (2023) - p. 140058 , 2023

Link: https://doi.org/10.1016/..

7

On The Contribution of Secondary Holes in Hot-Carrier Degra..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),

Tyaginov, S.E. ; Bury, E. ; Grill, A.... - p. 1-3 , 2023

Link: https://doi.org/10.1109/..

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Structure, electronic properties, and energetics of oxygen ..:

El-Sayed, Al-Moatasem ; Jech, Markus ; Waldhör, Dominic...
Physical Review Materials. 6 (2022) 12 - p. , 2022

Link: https://doi.org/10.1103/..

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The performance limits of hexagonal boron nitride as an ins..:

Knobloch, Theresia ; Illarionov, Yury Yu. ; Ducry, Fabian...
Nature Electronics. 4 (2021) 2 - p. 98-108 , 2021

Link: https://doi.org/10.1038/..

10

Reliability of scalable MoS2 FETs with 2 nm crystalline CaF..:

Illarionov, Yury Yu ; Banshchikov, Alexander G ; Polyushkin, Dmitry K...
2D Materials. 6 (2019) 4 - p. 045004 , 2019

Link: https://doi.org/10.1088/..

11

Trends in Reverse-Current Change in Tunnel MIS Diodes with ..:

Banshchikov, A. G. ; Illarionov, Yu. Yu. ; Vexler, M. I...
Semiconductors. 53 (2019) 6 - p. 833-837 , 2019

Link: https://doi.org/10.1134/..

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Analysis of the Features of Hot-Carrier Degradation in FinF..:

Makarov, A. A. ; Tyaginov, S. E. ; Kaczer, B....
Semiconductors. 52 (2018) 10 - p. 1298-1302 , 2018

Link: https://doi.org/10.1134/..

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Simulating Tunneling Electron Transport in the Semiconducto..:

Vexler, M. I.
Semiconductors. 52 (2018) 8 - p. 1031-1036 , 2018

Link: https://doi.org/10.1134/..

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Physical Principles of Self-Consistent Simulation of the Ge..:

Tyaginov, S. E. ; Makarov, A. A. ; Jech, M....
Semiconductors. 52 (2018) 2 - p. 242-247 , 2018

Link: https://doi.org/10.1134/..

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Impact of the Device Geometric Parameters on Hot-Carrier De..:

Tyaginov, S. E. ; Makarov, A. A. ; Kaczer, B....
Semiconductors. 52 (2018) 13 - p. 1738-1742 , 2018

Link: https://doi.org/10.1134/..