E-LIB Suche - Ergebnisse für: Volpi, F.

1

Unveiling materials and origin of reused medieval music par..:

Volpi, F. ; Fiocco, G. ; Gargano, M....
Microchemical Journal. 205 (2024) - p. 111224 , 2024

Link: https://doi.org/10.1016/..

2

Failure of a brittle layer on a ductile substrate: Nanoinde..:

Rusinowicz, M. ; Parry, G. ; Volpi, F....
Journal of the Mechanics and Physics of Solids. 163 (2022) - p. 104859 , 2022

Link: https://doi.org/10.1016/..

3

Development of a multifunctional nanoindenter integrated in..:

Volpi, F. ; Boujrouf, C. ; Rusinowicz, M....
Thin Solid Films. 735 (2021) - p. 138891 , 2021

Link: https://doi.org/10.1016/..

4

The role of artificial intelligence guided 3D automatic aug..:

Porpiglia, E. ; Checcucci, E. ; Amparore, D....
European Urology Open Science. 32 (2021) - p. S141 , 2021

Link: https://doi.org/10.1016/..

5

Cleaning oil paintings: NMR relaxometry and SPME to evaluat..:

Prati, S. ; Sciutto, G. ; Volpi, F....
New Journal of Chemistry. 43 (2019) 21 - p. 8229-8238 , 2019

Link: https://doi.org/10.1039/..

6

Development and Application of a Multifunctional Nanoindent..:

, In: 2019 IEEE Holm Conference on Electrical Contacts,

Comby-Dassonneville, S. ; Charlot, F. ; Martin, R.... - p. 1-8 , 2019

Link: https://doi.org/10.1109/..

7

Aluminum nitride thin films deposited by hydrogen plasma en..:

Tian, L. ; Ponton, S. ; Benz, M....
Surface and Coatings Technology. 347 (2018) - p. 181-190 , 2018

Link: https://doi.org/10.1016/..

8

Multiscale modeling of the anisotropic electrical conductiv..:

Gu, T. ; Medy, J.-R. ; Volpi, F....
Acta Materialia. 141 (2017) - p. 131-141 , 2017

Link: https://doi.org/10.1016/..

9

Dual mechanical behaviour of hydrogen in stressed silicon n..:

Volpi, F. ; Braccini, M. ; Devos, A....
Journal of Applied Physics. 116 (2014) 4 - p. , 2014

Link: https://doi.org/10.1063/..

10

Elastic properties of tensile nitrogen-plasma-treated multi..:

Braccini, M. ; Volpi, F. ; Devos, A....
Thin Solid Films. 551 (2014) - p. 120-126 , 2014

Link: https://doi.org/10.1016/..

11

Identification of the (√E+1/E)-dependence of porous low-k t..:

Chery, E. ; Federspiel, X. ; Roy, D...
Microelectronic Engineering. 109 (2013) - p. 90-93 , 2013

Link: https://doi.org/10.1016/..

12

The Myth of the Clash of Civilizations * By CHIARA BOTTICI ..:

Volpi, F.
Journal of Islamic Studies. 23 (2011) 1 - p. 120-122 , 2011

Link: https://doi.org/10.1093/..

13

Mapping of elastic modulus at sub-micrometer scale with aco..:

Mège, F. ; Volpi, F. ; Verdier, M.
Microelectronic Engineering. 87 (2010) 3 - p. 416-420 , 2010

Link: https://doi.org/10.1016/..

14

Characterization of low-k SiOCH dielectric for 45nm technol..:

Vilmay, M. ; Roy, D. ; Volpi, F..
Microelectronic Engineering. 85 (2008) 10 - p. 2075-2078 , 2008

Link: https://doi.org/10.1016/..

15

XPS studies of the ALD-growth of TaN diffusion barriers: Im..:

Volpi, F. ; Cadix, L. ; Berthomé, G....
Microelectronic Engineering. 85 (2008) 10 - p. 2068-2070 , 2008

Link: https://doi.org/10.1016/..