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Voykov, Stefan Nikolaev
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Integrated Wafer and Die Level Simulation of Back End of Li..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Katakamsetty, Ushasree ; Voykov, Stefan Nikolaev ; Vasilev, Boris... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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When tuberous sclerosis complex becomes an emergency:

Voykov, Bogomil ; Guenova, Emmanuella ; Papageorgiou, Eleni..
Canadian Journal of Ophthalmology.  44 (2009)  2 - p. 220-221 , 2009
Link: https://doi.org/10.3129/..
 
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