Vrignon, Bertrand
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1

A New Approach to Modeling the Impact of EMI on MOSFET DC B..:

FERNANDEZ-GARCIA, Raúl ; GIL, Ignacio ; BOYER, Alexandre..
IEICE Transactions on Electronics.  E94-C (2011)  12 - p. 1906-1908 , 2011
 
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2

Modeling Magnetic Near-Field Injection at Silicon Die Level:

Boyer, Alexandre ; Vrignon, Bertrand ; Cavarroc, Manuel
info:eu-repo/semantics/altIdentifier/doi/10.1109/TEMC.2015.2486041.  , 2015
 
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3

Modeling Magnetic Near-Field Injection at Silicon Die Level:

Boyer, Alexandre ; Vrignon, Bertrand ; Cavarroc, Manuel
info:eu-repo/semantics/altIdentifier/doi/10.1109/TEMC.2015.2486041.  , 2015
 
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4

Modeling Magnetic Near-Field Injection at Silicon Die Level:

Boyer, Alexandre ; Vrignon, Bertrand ; Cavarroc, Manuel
info:eu-repo/semantics/altIdentifier/doi/10.1109/TEMC.2015.2486041.  , 2015
 
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5

Modeling Magnetic Near-Field Injection at Silicon Die Level:

Boyer, Alexandre ; Vrignon, Bertrand ; Cavarroc, Manuel
info:eu-repo/semantics/altIdentifier/doi/10.1109/TEMC.2015.2486041.  , 2015
 
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9

Modeling and Simulation of LDO Voltage Regulator Susceptibi..:

Wu, Jianfei ; Boyer, Alexandre ; Li, Jiancheng...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TEMC.2013.2294951.  , 2014
 
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13

Modeling and Simulation of LDO Voltage Regulator Susceptibi..:

Wu, Jianfei ; Boyer, Alexandre ; Li, Jiancheng...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TEMC.2013.2294951.  , 2014
 
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14

Modeling and Simulation of LDO Voltage Regulator Susceptibi..:

Wu, Jianfei ; Boyer, Alexandre ; Li, Jiancheng...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TEMC.2013.2294951.  , 2014
 
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