WAKEJIMA, Akio
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1

Improved Turn-On Voltage Controllability in AlGaN/GaN Gated..:

Ando, Yuji ; Oishi, Kensuke ; Takahashi, Hidemasa...
IEEE Transactions on Electron Devices.  71 (2024)  5 - p. 2936-2942 , 2024
 
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Transient thermal analysis of GaN HEMT under TDD-LTE signal..:

, In: 2023 Asia-Pacific Microwave Conference (APMC),
Ito, Shunsuke ; Tsuchiya, Yoichi ; Tanaka, Atsushi... - p. 567-569 , 2023
 
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6

Bias-Dependence of Electroluminescence in AlGaN/GaN High-El..:

Ma, Qiang ; Urano, Shiyo ; Tanaka, Atsushi..
IEEE Journal of the Electron Devices Society.  10 (2022)  - p. 297-300 , 2022
 
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7

Influence of a thick nitride layer on transmission loss in ..:

Bose, Arijit ; Biswas, Debaleen ; Hishiki, Shigeomi...
IEICE Electronics Express.  19 (2022)  4 - p. 20210563-20210563 , 2022
 
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10

Dependence of Electrical Characteristics on Epitaxial Layer..:

Ando, Yuji ; Makisako, Ryutaro ; Takahashi, Hidemasa..
IEEE Transactions on Electron Devices.  69 (2022)  1 - p. 88-95 , 2022
 
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11

An Accurate Approach to Develop Small Signal Circuit Models..:

Jadhav, Aakash ; Ozawa, Takashi ; Baratov, Ali...
IEEE Journal of the Electron Devices Society.  10 (2022)  - p. 797-807 , 2022
 
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14

AlGaN/GaN HEMT on 3C-SiC/Low-Resistivity Si Substrate for M..:

WAKEJIMA, Akio ; BOSE, Arijit ; BISWAS, Debaleen...
IEICE Transactions on Electronics.  E105.C (2022)  10 - p. 457-465 , 2022
 
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