Waeytens, Ruben
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2

Reduced-Order Stochastic Testing of Interconnects Subject t..:

, In: 2023 IEEE 27th Workshop on Signal and Power Integrity (SPI),
 
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An extended 3-compartment model for describing step change ..:

Waeytens, Ruben ; De Souter, Lisa ; Grymonpré, Wouter...
International Journal of Pharmaceutics.  627 (2022)  - p. 122154 , 2022
 
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Analysis of the Influence of Roughness on the Propagation C..:

, In: 2020 IEEE 29th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS),
 
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