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2021 IEEE International Reliability Physics Symposium (IRPS) ,
5
On the impact of buffer and GaN-channel thickness on curren..:
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2020 IEEE International Reliability Physics Symposium (IRPS) ,
12
Exploring the DC reliability metrics for scaled GaN-on-Si d..:
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2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) ,
15