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Wang, Arex
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60.1: Invited Paper: Color and Image Enhancement for Large-..:

Liu, C. T. ; Wang, Arex ; Hong, Hong-Jye...
SID Symposium Digest of Technical Papers.  36 (2005)  1 - p. 1730 , 2005
Link: https://doi.org/10.1889/..
 
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Characterization of a Burn-in Failure Caused by a Defective..:

, In: 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits,
Wang, Fred S. C. ; Chiu, Yi ; Lin, Keh-la... - p. None , 2006
Link: https://doi.org/10.1109/..
 
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