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2024 IEEE International Reliability Physics Symposium (IRPS) ,
2
Layout Guidelines against Charging Damage from the Well-Sid..:
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2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) ,
3
Investigation of Latch-Up Immunity in 0.18-f.1M BCD Process..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
7
Protection Schemes for Plasma Induced Damage from Well-Side..:
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2022 IET International Conference on Engineering Technologies and Applications (IET-ICETA) ,
12