Wang, Zujun
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3

Degradation analysis of the pinned photodiode CMOS image se..:

Wang, Zujun ; Xue, Yuanyuan ; Wang, Zhongming...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  1058 (2024)  - p. 168784 , 2024
 
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5

Improving Radiation Reliability of SRAM-Based Physical Uncl..:

Chen, Zhuojun ; Yang, Wenhao ; Chen, Jinghang..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  32 (2024)  2 - p. 372-381 , 2024
 
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6

The simulation of electron transport of dielectric material..:

Yin, Liyuan ; Wang, Zujun ; Wu, Quan...
Radiation Effects and Defects in Solids.  179 (2024)  1-2 - p. 127-135 , 2024
 
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A simulation result of trapped charge in PPD CIS induced by..:

Lai, Shankun ; Wang, Zujun ; Huang, Gang...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  1050 (2023)  - p. 168069 , 2023
 
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12

Radiation effects in backside-illuminated CMOS image sensor..:

Wang, Zujun ; Xue, Yuanyuan ; Chen, Wei...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  1026 (2022)  - p. 166154 , 2022
 
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15

Molecular dynamics study on single particle displacement da..:

Jia, Tongxuan ; Yang, Xie ; Wang, Zujun...
Journal of Physics: Conference Series.  2133 (2021)  1 - p. 012042 , 2021
 
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