Watanabe, Yukihiko
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1

Evaluation of Trap Parameters of RC-IGBT After Repetitive A..:

, In: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD),
 
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6

An extraction method of channel resistance for analysis of ..:

Kutsuki, Katsuhiro ; Kagoshima, Eiji ; Onishi, Toru...
Japanese Journal of Applied Physics.  59 (2020)  SG - p. SGGD04 , 2020
 
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11

Effect of surface roughness of trench sidewalls on electric..:

Kutsuki, Katsuhiro ; Murakami, Yuki ; Watanabe, Yukihiko...
Japanese Journal of Applied Physics.  57 (2018)  4S - p. 04FR02 , 2018
 
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12

X-ray absorption spectroscopy study on SiC-side interface s..:

Isomura, Noritake ; Kosaka, Satoru ; Kataoka, Keita..
Japanese Journal of Applied Physics.  57 (2018)  6 - p. 060308 , 2018
 
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13

Chemical-state-selective X-ray absorption spectroscopy by d..:

Isomura, Noritake ; Murai, Takaaki ; Oji, Hiroshi...
Japanese Journal of Applied Physics.  56 (2017)  8 - p. 081301 , 2017
 
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