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Wattamwar, S.K ; Weiland, S ; Backx, A.C.P.M Wattamwar , S K , Weiland , S & Backx , A C P M 2010 , State information based identification methods towards low order modeling . in Proceedings of the 2010 IEEE International Conference on Control Applications (CCA), 8-10 September 2010, Yokohama, Japan . Institute of Electrical and Electronics Engineers , Piscataway , pp. 665-670 . https://doi.org/10.1109/CCA.2010.5611246.
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Wattamwar, S.K ; Weiland, S ; Backx, A.C.P.M Wattamwar , S K , Weiland , S & Backx , A C P M 2008 , Identification of Low Dimensional Models for slow Geometric Parameter Variation in an Industrial Glass Manufacturing Process . in Control Applications, 2008. CCA 2008. 17th IEEE International Conference on applications, 3-5-09-2008, San Antonio, Texas USA . Institute of Electrical and Electronics Engineers , Piscataway . https://doi.org/10.1109/CCA.2008.4629689.
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