Search for persons
X
?
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) ,
2
An Evaluation for Quality Inspection of Epitaxial Layer and..:
, In:
?
Advances in Intelligent Systems and Computing; Recent Trends in Data Science and Soft Computing ,
9
A Survey on SCADA Security and Honeypot in Industrial Contr..:
, In:
?
2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) ,
15