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Advances in Human Error, Reliability, Resilience, and Performance; Advances in Intelligent Systems and Computing ,
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Organizational Resilience Model in a Nuclear Power Plant:
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2016 IEEE Symposium on VLSI Technology ,
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High aspect ratio InGaAs FinFETs with sub-20 nm fin width:
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2015 IEEE International Conference on Progress in Informatics and Computing (PIC) ,
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