Wernicke, Tobias
22  results:
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1

Investigation on the use of Al-Ge eutectic bonding in the s..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
Wang, Jun ; Mannarino, Manuel ; Visker, Jakob... - p. 2008-2012 , 2024
 
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0.5 μm Pitch Wafer-to-wafer Hybrid Bonding at Low Temperatu..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
Ma, Kai ; Bekiaris, Nikolaos ; Hsu, Ching-Hsiang... - p. 331-336 , 2024
 
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Demonstrating 170 °C Low-Temperature Cu–In–Sn Wafer-Level S..:

Vuorinen, Vesa ; Ross, Glenn ; Klami, Anton...
IEEE Transactions on Components, Packaging and Manufacturing Technology.  12 (2022)  3 - p. 446-453 , 2022
 
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Study of Cu-Sn-In system for low temperature, wafer level s..:

, In: 2020 IEEE 8th Electronics System-Integration Technology Conference (ESTC),
 
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10

Demonstrating 170°C Low Temperature Cu-In-Sn wafer level So..:

Vuorinen, Vesa ; Ross, Glenn ; Klami, Anton...
info:eu-repo/grantAgreement/EC/H2020/826588/EU//APPLAUSE.  , 2022
 
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15

Assessing moisture sources of precipitation in the Western ..:

Juhlke, Tobias R. ; Meier, Christiane ; Van Geldern, Robert...
Tellus B: Chemical and Physical Meteorology.  71 (2019)  1 - p. 1601987 , 2019
 
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