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Wirth, Gilson I.
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1

Random Telegraph Noise in Analog CMOS Circuits:

da Silva, Mauricio Banaszeski ; Wirth, Gilson I. ; Tuinhout, Hans P...
IEEE Transactions on Circuits and Systems I: Regular Papers.  70 (2023)  6 - p. 2229-2242 , 2023
Link: https://doi.org/10.1109/..
 
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2

Correlation of HCD and Percolation Paths in FinFETs: Study ..:

Furtado, Gabriela F. ; Camargo, Vinicius V. A. ; Vasileska, Dragica.
IEEE Transactions on Device and Materials Reliability.  22 (2022)  3 - p. 381-386 , 2022
Link: https://doi.org/10.1109/..
 
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3

Random Telegraph Noise Modeling for Circuit Analysis: RTN i..:

da Silva, Mauricio Banaszeski ; Both, Thiago H. ; Wirth, Gilson I.
IEEE Journal of the Electron Devices Society.  10 (2022)  - p. 459-465 , 2022
Link: https://doi.org/10.1109/..
 
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4

Extraction of the Back Channel Mobility in SOI Nanowire MOS..:

, In: 2022 IEEE Latin American Electron Devices Conference (LAEDC),
Bergamaschi, Flavio E. ; Wirth, Gilson I. ; Barraud, Sylvain... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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5

Evaluating the Ballistic Transport in nFinFETs: A Carrier C..:

Furtado, Gabriela F. ; Camargo, Vinicius V. A. ; Vasileska, Dragica.
IEEE Transactions on Nanotechnology.  21 (2022)  - p. 311-319 , 2022
Link: https://doi.org/10.1109/..
 
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6

Modeling Quantum Confinement in Multi-Gate Transistors with..:

, In: 2022 36th Symposium on Microelectronics Technology (SBMICRO),
Soares, Caroline S. ; Baikadi, Pranay K. R. ; Rossetto, Alan C. J.... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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7

3-D non-isothermal particle-based device simulator for p-ty..:

Rossetto, Alan C. J. ; Camargo, Vinicius V. A. ; Vasileska, Dragica.
Journal of Computational Electronics.  20 (2021)  5 - p. 1644-1656 , 2021
Link: https://doi.org/10.1007/..
 
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8

3-D Monte Carlo device simulator for variability modeling o..:

Camargo, Vinicius V. A. ; Rossetto, Alan C. J. ; Vasileska, Dragica.
Journal of Computational Electronics.  19 (2020)  2 - p. 668-676 , 2020
Link: https://doi.org/10.1007/..
 
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9

Statistical analysis of the impact of charge traps in p-typ..:

Rossetto, Alan C. J. ; Camargo, Vinicius V. A. ; Both, Thiago H...
Journal of Computational Electronics.  19 (2020)  2 - p. 648-657 , 2020
Link: https://doi.org/10.1007/..
 
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10

TID effects on I–V characteristics of bulk CMOS STD and ELT..:

Vaz, Pablo I. ; Wirth, Gilson I. ; Vidor, Fábio F..
Microelectronics Journal.  97 (2020)  - p. 104722 , 2020
Link: https://doi.org/10.1016/..
 
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11

An Overview on Statistical Modeling of Random Telegraph Noi..:

, In: Noise in Nanoscale Semiconductor Devices,
Both, Thiago H. ; da Silva, Maurício Banaszeski ; Wirth, Gilson I.... - p. 495-516 , 2020
Link: https://doi.org/10.1007/..
 
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12

A Negative-Bias-Temperature-Instability Study on Omega-Gate..:

, In: 2019 34th Symposium on Microelectronics Technology and Devices (SBMicro),
Silva, Vanessa C. P. ; Wirth, Gilson I. ; Martino, Joao A.. - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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13

Inverter circuits on freestanding flexible substrate using ..:

Vidor, Fábio F. ; Meyers, Thorsten ; Müller, Kathrin..
Solid-State Electronics.  137 (2017)  - p. 16-21 , 2017
Link: https://doi.org/10.1016/..
 
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14

MagPDK : an open-source process design kit for circuit d..:

, In: Proceedings of the 29th Symposium on Integrated Circuits and Systems Design: Chip on the Mountains,
Brum, Raphael M. ; Wirth, Gilson I. - p. 1-6 , 2017
Link: https://dl.acm.org/doi/1..
 
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15

ZnO nanoparticle thin-film transistors on flexible substrat..:

Vidor, Fábio F. ; Meyers, Thorsten ; Wirth, Gilson I..
Microelectronic Engineering.  159 (2016)  - p. 155-158 , 2016
Link: https://doi.org/10.1016/..
 
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