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Wittpahl, V.
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Quantitative high frequency-electric force microscope testi..:

Wittpahl, V. ; Ney, C. ; Behnke, U...
Microelectronics Reliability.  39 (1999)  6-7 - p. 951-956 , 1999
Link: https://doi.org/10.1016/..
 
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Cantilever influence suppression of contactless IC-testing ..:

Wittpahl, V. ; Behnke, U. ; Wand, B..
Microelectronics Reliability.  38 (1998)  6-8 - p. 981-986 , 1998
Link: https://doi.org/10.1016/..
 
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