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Witulski, Arthur F.
31  results:
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1

LET and Voltage Dependence of Single-Event Burnout and Sing..:

Sengupta, Arijit ; Ball, Dennis R. ; Sternberg, Andrew L....
IEEE Transactions on Nuclear Science.  71 (2024)  4 - p. 809-815 , 2024
Link: https://doi.org/10.1109/..
 
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2

Single Event Functional Interrupt (SEFI) Sensitivities of a..:

, In: 2024 IEEE Aerospace Conference,
Esquer, Stefania ; Sierawski, Brian. D. ; Witulski, Arthur F.... - p. 1-11 , 2024
Link: https://doi.org/10.1109/..
 
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3

Influence of Radiation Environment Variability on Cumulativ..:

Johnson, Robert A. ; Witulski, Arthur F. ; Sierawski, Brian D....
IEEE Transactions on Nuclear Science.  70 (2023)  4 - p. 322-327 , 2023
Link: https://doi.org/10.1109/..
 
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4

Impact of Heavy-Ion Range on Single-Event Effects in Silico..:

Sengupta, Arijit ; Ball, Dennis R. ; Witulski, Arthur F....
IEEE Transactions on Nuclear Science.  70 (2023)  4 - p. 394-400 , 2023
Link: https://doi.org/10.1109/..
 
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5

Incorporating Component-Level Testing Into Bayesian Degrada..:

Nederlander, Richard H. ; Witulski, Arthur F. ; Reed, Robert A....
IEEE Transactions on Nuclear Science.  70 (2023)  8 - p. 2051-2059 , 2023
Link: https://doi.org/10.1109/..
 
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6

System-level Uncertainty Quantification from Component-leve..:

, In: 2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Karsai, Gabor ; Mahadevan, Nag ; Witulski, Arthur F.... - p. 1-4 , 2021
Link: https://doi.org/10.1109/..
 
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7

Automatic Fault Tree Generation from Radiation-Induced Faul..:

, In: 2020 Annual Reliability and Maintainability Symposium (RAMS),
Austin, Rebekah A. ; Mahadevan, Nagabhushan ; Witulski, Arthur F.... - p. 1-7 , 2020
Link: https://doi.org/10.1109/..
 
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8

New Insight into Single-Event Radiation Failure Mechanisms ..:

Witulski, Arthur F. ; Ball, Dennis R. ; Johnson, Robert A....
Materials Science Forum.  1004 (2020)  - p. 1066-1073 , 2020
Link: https://doi.org/10.4028/..
 
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9

Parasitic Bipolar Action in SiC Power MOSFETs Demonstrated ..:

, In: 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Johnson, Robert A. ; Witulski, Arthur F. ; Ball, Dennis R.... - p. 1-4 , 2018
Link: https://doi.org/10.1109/..
 
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10

Failure Estimates for SiC Power MOSFETs in Space Electronic:

Galloway, Kenneth F. ; Witulski, Arthur F. ; Schrimpf, Ronald D....
Aerospace.  5 (2018)  3 - p. 67 , 2018
Link: https://doi.org/10.3390/..
 
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11

A Bulk Built-In Voltage Sensor to Detect Physical Location ..:

Zhang, Zhichao ; Ren, Yi ; Chen, Li...
Journal of Electronic Testing.  29 (2013)  2 - p. 249-253 , 2013
Link: https://doi.org/10.1007/..
 
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12

Small signal ac equivalent circuit modelling of the series ..:

, In: 1987 IEEE Power Electronics Specialists Conference,
Witulski, Arthur F. ; Erickson, Robert W. - p. 693-704 , 1987
Link: https://doi.org/10.1109/..
 
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13

Systems engineering and assurance modeling (SEAM): A web-ba..:

Ryder L., Kaitlyn ; Alles, Ryan ; Karsai, Gabor...
Facta universitatis - series: Electronics and Energetics.  34 (2021)  1 - p. 1-20 , 2021
Link: https://doi.org/10.2298/..
 
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14

SYSTEMS ENGINEERING AND ASSURANCE MODELING (SEAM): A WEB-BA..:

Ryder, Kaitlyn L ; Alles, Ryan ; Karsai, Gabor...
http://casopisi.junis.ni.ac.rs/index.php/FUElectEnerg/article/view/7037/4065.  , 2021
Link: http://casopisi.junis.ni..
 
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15

Enhanced Charge Collection in SiC Power MOSFETs Demonstrate..:

Johnson, Robert A ; Witulski, Arthur F ; Ball, Dennis R...
IEEE Transactions on Nuclear Science.  , 2019
Link: http://urn.fi/URN:NBN:fi..
 
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