E-LIB Suche - Ergebnisse für: Wolf, Heinrich

1

System Level ESD Testing with Capacitively Coupled Stress P..:

, In: 2022 44th Annual EOS/ESD Symposium (EOS/ESD),

Jirutkova, Ellen ; Wolf, Heinrich ; Weber, Johannes. - p. 1-7 , 2022

Link: https://doi.org/10.23919..

2

Discharge current analysis with charged connector pins:

Tamminen, Pasi ; Fung, Rita ; Wong, Rick..
Microelectronics Reliability. 115 (2020) - p. 113977 , 2020

Link: https://doi.org/10.1016/..

3

Unspezifisch und veraltet

, In: Musikforum / Deutscher Musikrat

eine kritische Betrachtung der UNESCO-Liste zum immateriell...

Opitz, Wolfgang ; Wolf, Heinrich ; Bartels, David.... (2015) 3 - p. 13-15

Copies: Zentrale;

4

An adapted filament model for accurate modeling of printed ..:

Curran, Brian ; Ndip, Ivan ; Werner, Christian...
International Journal of Microwave and Wireless Technologies. 2 (2010) 3-4 - p. 273-281 , 2010

Link: https://doi.org/10.1017/..

5

Modeling and measurement of coplanar transmission lines wit..:

, In: 2009 European Microwave Conference (EuMC),

Curran, Brian ; Ndip, Ivan ; Werner, Christian... - p. None , 2009

Link: https://doi.org/10.23919..

6

Investigating the CDM susceptibility of IC's at package and..:

Wolf, Heinrich ; Gieser, Horst ; Walter, Dirk
Microelectronics Reliability. 49 (2009) 12 - p. 1476-1481 , 2009

Link: https://doi.org/10.1016/..

7

Atlas zur Verbreitung der Wegwespen in Deutschland (Hymenop..

Abhandlungen aus dem Westfälischen Museum für Naturkunde ; 70,2

Wolf, Heinrich ; Woydak, Horst , 2008

Copies: Zentrale:E02 z nat 732.5 ja/011-70

8

ESD Susceptibility of Submicron Air Gaps:

Wolf, Heinrich ; Gieser, Horst ; Bonfert, Detlef.
Microelectronics Reliability. 46 (2006) 9-11 - p. 1587-1590 , 2006

Link: https://doi.org/10.1016/..

9

A Dedicated TLP Set-Up to Investigate the ESD Robustness of..:

Wolf, Heinrich ; Gieser, Horst ; Soldner, Wolfgang.
Microelectronics Reliability. 45 (2005) 9-11 - p. 1421-1424 , 2005

Link: https://doi.org/10.1016/..

10

Capacitively coupled transmission line pulsing cc-TLP––a tr..:

Wolf, Heinrich ; Gieser, Horst ; Stadler, Wolfgang.
Microelectronics Reliability. 45 (2005) 2 - p. 279-285 , 2005

Link: https://doi.org/10.1016/..

11

ESD-level circuit simulation impact of interconnect RC-dela..:

Mergens, Markus P.J ; Wilkening, Wolfgang ; Kiesewetter, Gerhard...
Journal of Electrostatics. 54 (2002) 1 - p. 105-125 , 2002

Link: https://doi.org/10.1016/..

12

The Pompilidae (Hymenoptera: Aculeata) fauna of Turkey: Par..:

Özbek, Hikmet ; Yıldırım, Erol ; Wolf, Heinrich.
Zoology in the Middle East. 21 (2000) 1 - p. 109-128 , 2000

Link: https://doi.org/10.1080/..

13

Modular approach of a high current MOS compact model for ci..:

Mergens, Markus ; Wilkening, Wolfgang ; Mettler, Stephan..
Microelectronics Reliability. 40 (2000) 1 - p. 99-115 , 2000

Link: https://doi.org/10.1016/..

14

Analyzing the switching behavior of ESD-protection transist..:

Wolf, Heinrich ; Gieser, Horst ; Wilkening, Wolfgang
Journal of Electrostatics. 49 (2000) 3-4 - p. 111-127 , 2000

Link: https://doi.org/10.1016/..

15

Characterization and optimization of a bipolar ESD-device b..:

Stricker, Andreas D. ; Mettler, Stephan ; Wolf, Heinrich...
Microelectronics Reliability. 39 (1999) 11 - p. 1563-1577 , 1999

Link: https://doi.org/10.1016/..