Wolkow, Robert
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7

Atomic defect classification of the H–Si(100) surface throu..:

Croshaw, Jeremiah ; Dienel, Thomas ; Huff, Taleana.
Beilstein Journal of Nanotechnology.  11 (2020)  - p. 1346-1360 , 2020
 
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8

Deep learning-guided surface characterization for autonomou..:

Rashidi, Mohammad ; Croshaw, Jeremiah ; Mastel, Kieran...
Machine Learning: Science and Technology.  1 (2020)  2 - p. 025001 , 2020
 
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