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Wolters, Rob
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1

Influence of Surrounding Dielectrics on the Data Retention ..:

Jedema, Friso ; Zandt, Micha in `t ; Wolters, Rob.
Japanese Journal of Applied Physics.  50 (2011)  2R - p. 024102 , 2011
Link: https://doi.org/10.1143/..
 
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2

Negative Charge in Plasma Oxidized SiO2 Layers:

Boogaard, Arjen ; Kovalgin, Alexey Y. ; Wolters, Rob
ECS Transactions.  35 (2011)  4 - p. 259-272 , 2011
Link: https://doi.org/10.1149/..
 
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3

Influence of Surrounding Dielectrics on the Data Retention ..:

Jedema, Friso ; Zandt, Micha in `t ; Wolters, Rob.
Japanese Journal of Applied Physics.  50 (2011)  2R - p. 024102 , 2011
Link: https://doi.org/10.7567/..
 
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4

Nano-Link Based Ultra Low Power Micro Electronic Hotplates ..:

Groenland, Alfons W. ; Wolters, Rob A. ; Kovalgin, Alexey Y..
ECS Transactions.  35 (2011)  30 - p. 25-34 , 2011
Link: https://doi.org/10.1149/..
 
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5

Qualitative and quantitative characterization of outgassing..:

Melai, Joost ; Salm, Cora ; Wolters, Rob.
Microelectronic Engineering.  86 (2009)  4-6 - p. 761-764 , 2009
Link: https://doi.org/10.1016/..
 
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6

Impact of Small Deviations in EEDF on Silane-based Plasma C..:

Kovalgin, Alexey ; Boogaard, Arjen ; Wolters, Rob
ECS Transactions.  25 (2009)  8 - p. 429-436 , 2009
Link: https://doi.org/10.1149/..
 
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7

Electrical Properties of Plasma-Deposited Silicon Oxide Cla..:

Kovalgin, Alexey ; Boogaard, Arjen ; Brunets, Ihor..
ECS Transactions.  25 (2009)  8 - p. 23-32 , 2009
Link: https://doi.org/10.1149/..
 
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8

Experimental Hardware for Coating PUFs and Optical PUFs:

, In: Security with Noisy Data,
Skoric, Boris ; Schrijen, Geert-Jan ; Ophey, Wil... - p. 255-268 , 2007
Link: https://doi.org/10.1007/..
 
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9

Langmuir-probe Characterization of an Inductively-Coupled R..:

Boogaard, Arjen ; Kovalgin, Alexey ; Aarnink, Tom...
ECS Transactions.  2 (2007)  7 - p. 181-191 , 2007
Link: https://doi.org/10.1149/..
 
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10

The Dependence of the Stress of Chemical Vapor Deposited Tu..:

Schmitz, John ; Kang, Sien ; Wolters, Rob.
Journal of The Electrochemical Society.  141 (1994)  3 - p. 843-848 , 1994
Link: https://doi.org/10.1149/..
 
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11

Hot Wire ALD: Hot‐Wire Assisted ALD: A Study Powered by In ..:

Kovalgin, Alexey Y. ; Yang, Mengdi ; Banerjee, Sourish...
Advanced Materials Interfaces.  4 (2017)  18 - p. , 2017
Link: https://doi.org/10.1002/..
 
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12

Hot‐Wire Assisted ALD: A Study Powered by In Situ Spectrosc..:

Kovalgin, Alexey Y. ; Yang, Mengdi ; Banerjee, Sourish...
Advanced Materials Interfaces.  4 (2017)  18 - p. , 2017
Link: https://doi.org/10.1002/..
 
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13

Effects of Oxygen, Nitrogen and Fluorine on the Crystallini..:

Yang, Mengdi ; Aarnink, Antonius A. I. ; Wolters, Rob A. M...
ECS Journal of Solid State Science and Technology.  6 (2017)  12 - p. P839-P844 , 2017
Link: https://doi.org/10.1149/..
 
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14

Hot-wire assisted ALD of tungsten films:In-situstudy of the..:

Yang, Mengdi ; Aarnink, Antonius A. I. ; Kovalgin, Alexey Y...
physica status solidi (a).  212 (2015)  7 - p. 1607-1614 , 2015
Link: https://doi.org/10.1002/..
 
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15

Conduction and electric field effect in ultra-thin TiN film:

Van Bui, Hao ; Kovalgin, Alexey Y. ; Schmitz, Jurriaan.
Applied Physics Letters.  103 (2013)  5 - p. , 2013
Link: https://doi.org/10.1063/..
 
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