Woo, Jongho
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4

Drain Current Degradation Induced by Charge Trapping/De-Tra..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Kim, Taeyoung ; Lim, Suhwan ; Myeong, Ilho... - p. P6.EM-1-P6.EM-4 , 2024
 
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5

A Comprehensive Study of Read-After-Write-Delay for Ferroel..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Myeong, Ilho ; Lim, Suhwan ; Kim, Taeyoung... - p. 9B.3-1-9B.3-6 , 2024
 
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6

Comprehensive Design Guidelines of Gate Stack for QLC and H..:

, In: 2023 International Electron Devices Meeting (IEDM),
Lim, Suhwan ; Kim, Taeyoung ; Myeong, Ilho... - p. 1-4 , 2023
 
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8

An improvement of snow/cloud discrimination from machine le..:

Jin, Donghyun ; Lee, Kyeong-Sang ; Choi, Sungwon...
International Journal of Digital Earth.  15 (2022)  1 - p. 2355-2375 , 2022
 
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15

Static and dynamic analysis of airships:

Woo, Jong-Ho ; Murthy, V. R.
Journal of Aircraft.  25 (1988)  9 - p. 790-795 , 1988
 
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