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2023 IEEE Energy Conversion Congress and Exposition (ECCE) ,
6
Observations on Ruggedness Degradation of Planar-gate SiC M..:
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2023 5th International Conference on Radiation Effects of Electronic Devices (ICREED) ,
7
Investigation on Dynamic Characteristic Variations Caused b..:
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2023 IEEE Energy Conversion Congress and Exposition (ECCE) ,
13
Investigation on Dynamic Degradation of SiC MOSFETs after T..:
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2022 IEEE International Power Electronics and Application Conference and Exposition (PEAC) ,
14