Xu, Gaobo
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1

Impact of Thickness Dependent Ferroelectric and Interface C..:

, In: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC),
Zhang, Fan ; Zhang, Zhaohao ; Huo, Jiali... - p. 1-3 , 2024
 
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6

Partially Isolated Dual Work Function Gate IGZO TFT With Ob..:

Bao, Yunjiao ; Yan, Gangping ; Cao, Lei...
IEEE Journal of the Electron Devices Society.  12 (2024)  - p. 637-644 , 2024
 
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8

Demonstration of EOT-Scaled FinFET Based on Thickness-Propo..:

Zhong, Kun ; Zhang, Fan ; Zhang, Zhaohao...
IEEE Electron Device Letters.  45 (2024)  7 - p. 1193-1196 , 2024
 
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9

The Endurance and Reliability Mechanisms Investigation of I..:

Luo, Jie ; Yang, Yanyu ; Yan, Gangping...
IEEE Journal of the Electron Devices Society.  12 (2024)  - p. 613-618 , 2024
 
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11

Unique Consecutive RTN Characteristics Coupled With Ferroel..:

Zhang, Fan ; Yang, Hong ; Zhang, Qingzhu...
IEEE Electron Device Letters.  45 (2024)  4 - p. 566-569 , 2024
 
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12

Investigation of Electrical Characteristics of a Fabricated..:

, In: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC),
Lu, Yupeng ; Sun, Peng ; Yan, Gangping... - p. 1-3 , 2024
 
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15

The performance of AC-coupled Strip LGAD developed by IHEP:

Sun, Weiyi ; Li, Mengzhao ; Liang, Zhijun...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  1062 (2024)  - p. 169203 , 2024
 
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