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2024 IEEE European Test Symposium (ETS) ,
1
Design-for-Test for Intermittent Faults in STT-MRAMs:
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2023 IEEE European Test Symposium (ETS) ,
3
Data Background-Based Test Development for All Interconnect..:
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2023 IEEE 32nd Asian Test Symposium (ATS) ,
4
Characterization and Test of Intermittent Over RESET in RRA..:
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2023 IEEE International Test Conference (ITC) ,
5
Device-Aware Test for Ion Depletion Defects in RRAMs:
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2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) ,
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