YAMAUCHI, Yukari
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An Estimation Method of Defect Types Using Artificial Neura..:

, In: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
 
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12

A Low Capture Power Test Generation Method Based on Capture..:

HOSOKAWA, Toshinori ; HIRAI, Atsushi ; YAMAUCHI, Yukari.
IEICE Transactions on Information and Systems.  E100.D (2017)  9 - p. 2118-2125 , 2017
 
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