Yalon, Eilam
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2

Bitwise Logic Using Phase Change Memory Devices Based on th..:

, In: 2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID),
Aflalo, Noa ; Yalon, Eilam ; Kvatinsky, Shahar - p. 583-586 , 2024
 
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3

Exploring Charge Trapping Dynamics in Si:HfO₂-FeFETs by Tem..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
 
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4

Resistance Drift Reset State and Read Voltage Dependencies ..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
 
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5

High-Speed Electrical Transient Thermometry of Monolayer Mo..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Ber, Emanuel ; Yalon, Eilam - p. 1-3 , 2024
 
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10

Thiol-based defect healing of WSe2 and WS2:

Schwarz, Aviv ; Alon-Yehezkel, Hadas ; Levi, Adi...
npj 2D Materials and Applications.  7 (2023)  1 - p. , 2023
 
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13

High Number of Transport Modes: A Requirement for Contact R..:

Ber, Emanuel ; Grady, Ryan W. ; Pop, Eric.
IEEE Transactions on Electron Devices.  70 (2023)  4 - p. 1829-1834 , 2023
 
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