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2023 China Semiconductor Technology International Conference (CSTIC) ,
5
Virtual Metrology Modeling for CVD Film Thickness With Lass..:
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2022 China Semiconductor Technology International Conference (CSTIC) ,
6
Based on Deep Learning CD-SEM Image Defect Detection System:
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2021 China Semiconductor Technology International Conference (CSTIC) ,
10
A Dynamic Sampling Algorithm Based on Cosrisk Assessment Mo..:
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2020 IEEE Photonics Conference (IPC) ,
15