E-LIB Suche - Ergebnisse für: Yan-Rong, Cao

1

The etching ofa-plane GaN epilayers grown by metal-organic ..:

Sheng-Rui, Xu ; Yue, Hao ; Jin-Cheng, Zhang...
Chinese Physics B. 19 (2010) 10 - p. 107204 , 2010

Link: https://doi.org/10.1088/..

2

The Anomalous Effect of Interface Traps on Generation Curre..:

Xiao-Hua, Ma ; Hai-Xia, Gao ; Yan-Rong, Cao..
Chinese Physics Letters. 27 (2010) 5 - p. 057301 , 2010

Link: https://doi.org/10.1088/..

3

Study on the drain bias effect on negative bias temperature..:

Yan-Rong, Cao ; Xiao-Hua, Ma ; Yue, Hao.
Chinese Physics B. 19 (2010) 4 - p. 047307 , 2010

Link: https://doi.org/10.1088/..

4

Effect of Channel Length and Width on NBTI in Ultra Deep Su..:

Yan-Rong, Cao ; Xiao-Hua, Ma ; Yue, Hao.
Chinese Physics Letters. 27 (2010) 3 - p. 037301 , 2010

Link: https://doi.org/10.1088/..

5

The study on mechanism and model of negative bias temperatu..:

Yan-Rong, Cao ; Xiao-Hua, Ma ; Yue, Hao.
Chinese Physics B. 19 (2010) 9 - p. 097306 , 2010

Link: https://doi.org/10.1088/..

6

Hot-Carrier Stress Effects on GIDL and SILC in 90nm LDD-MOS..:

Shi-Gang, Hu ; Yue, Hao ; Xiao-Hua, Ma...
Chinese Physics Letters. 26 (2009) 1 - p. 017304 , 2009

Link: https://doi.org/10.1088/..

7

Effect of substrate bias on negative bias temperature insta..:

Yan-Rong, Cao ; Yue, Hao ; Xiao-Hua, Ma.
Chinese Physics B. 18 (2009) 1 - p. 309-314 , 2009

Link: https://doi.org/10.1088/..

8

Study on the degradation of NMOSFETs with ultra-thin gate o..:

Shi-Gang, Hu ; Yue, Hao ; Xiao-Hua, Ma...
Chinese Physics B. 18 (2009) 12 - p. 5479-5484 , 2009

Link: https://doi.org/10.1088/..

9

SILC during NBTI Stress in PMOSFETs with Ultra-Thin SiON Ga..:

Yan-Rong, Cao ; Yue, Hao ; Xiao-Hua, Ma..
Chinese Physics Letters. 25 (2008) 4 - p. 1427-1430 , 2008

Link: https://doi.org/10.1088/..

10

Degradation of Ultra-Thin Gate Oxide NMOSFETs under CVDT an..:

Shi-Gang, Hu ; Yan-Rong, Cao ; Yue, Hao...
Chinese Physics Letters. 25 (2008) 11 - p. 4109-4112 , 2008

Link: https://doi.org/10.1088/..

11

Mechanism of NBTI Recovery under Negative Voltage Stress:

Yan-Rong, Cao ; Shi-Gang, Hu ; Xiao-Hua, Ma.
Chinese Physics Letters. 25 (2008) 9 - p. 3393-3396 , 2008

Link: https://doi.org/10.1088/..

12

Study on the recovery of NBTI of ultra-deep sub-micro MOSFE..:

Yan-Rong, Cao ; Xiao-Hua, Ma ; Yue, Hao...
Chinese Physics. 16 (2007) 4 - p. 1140-1144 , 2007

Link: https://doi.org/10.1088/..

13

Comparison of hot-hole injections in ultrashort channel LDD..:

Hai-Feng, Chen ; Yue, Hao ; Xiao-Hua, Ma...
Chinese Physics. 16 (2007) 10 - p. 3114-3119 , 2007

Link: https://doi.org/10.1088/..

14

New aspects of HCI test for ultra-short channel n-MOSFET de..:

Xiao-Hua, Ma ; Yue, Hao ; Jian-Ping, Wang..
Chinese Physics. 15 (2006) 11 - p. 2742-2745 , 2006

Link: https://doi.org/10.1088/..

15

Investigation of the characteristics of GIDL current in 90n..:

Hai-Feng, Chen ; Yue, Hao ; Xiao-Hua, Ma...
Chinese Physics. 15 (2006) 3 - p. 645-648 , 2006

Link: https://doi.org/10.1088/..