Yanagawa, Yoshimitsu
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2

Static charge outside chamber induces dielectric breakdown ..:

Matsui, Kazuma ; Goto, Yusuke ; Yanagi, Itaru...
Japanese Journal of Applied Physics.  57 (2018)  4 - p. 046702 , 2018
 
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4

Fluctuation Tolerant Charge-Integration Read Scheme for Ult..:

ONO, Kazuo ; YANAGAWA, Yoshimitsu ; KOTABE, Akira...
IEICE Transactions on Electronics.  E95.C (2012)  4 - p. 651-660 , 2012
 
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7

Huntington's disease with onset ages greater than 60 years:

Yoshida, Kunihiro ; Yanagawa, Sohei ; Tsuchiya, Ayako...
Geriatrics & Gerontology International.  7 (2007)  1 - p. 80-82 , 2007
 
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