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2024 IEEE International Reliability Physics Symposium (IRPS) ,
6
Charge Loss Improvement in 3D Flash Memory by Molecular Oxi..:
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2019 IEEE International Electron Devices Meeting (IEDM) ,
9
A Novel Double-Density Hemi-Cylindrical (HC) Structure to P..:
, In:
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2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) ,
12