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Yang, Jianqun
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1

Performance enhancement of 1.7 kV MOSFET using PIN-junction..:

Wang, Qing-yuan ; Wang, Ying ; Fei, Xin-Xing...
Microelectronics Reliability.  152 (2024)  - p. 115305 , 2024
Link: https://doi.org/10.1016/..
 
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2

Hydration induced mechanical degradation in the Y-doped BaZ..:

Wang, Zhaoyang ; Jing, Yuhang ; Sun, Yi...
Computational Materials Science.  235 (2024)  - p. 112824 , 2024
Link: https://doi.org/10.1016/..
 
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3

Drain-Leakage Degradation During Single-Event Burnout Exper..:

Liu, Feng-Kai ; Liu, Zhong-Li ; Wu, Lei...
IEEE Transactions on Electron Devices.  , 2024
Link: https://doi.org/10.1109/..
 
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4

Anomalous TID Susceptibility on Collector Bias for SOI High..:

Wei, Jianan ; Qiu, Sheng ; Fu, Jing...
IEEE Transactions on Electron Devices.  71 (2024)  7 - p. 4033-4038 , 2024
Link: https://doi.org/10.1109/..
 
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5

ERETCAD-Env: The 3-D Dynamic Simulation Software for On-Orb..:

Han, Yu ; Ying, Tao ; Li, Weiqi...
IEEE Transactions on Nuclear Science.  71 (2024)  5 - p. 1257-1264 , 2024
Link: https://doi.org/10.1109/..
 
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6

Bayesian Network Modeling of Transistor-Level Total Ionizin..:

Zhen, Zhaofeng ; Ying, Tao ; Song, Yang...
IEEE Transactions on Nuclear Science.  71 (2024)  5 - p. 1265-1272 , 2024
Link: https://doi.org/10.1109/..
 
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7

Defect Identification in β-Ga2O3 Schottky Barrier Diodes Wi..:

Huang, Yuanting ; Xu, Xiaodong ; Yang, Jianqun...
IEEE Transactions on Nuclear Science.  71 (2024)  5 - p. 1178-1185 , 2024
Link: https://doi.org/10.1109/..
 
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8

Multiscale insights into the radiation effect of semiconduc..:

Li, Huyang ; Jing, Yuhang ; Xu, Xiaodong...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.  550 (2024)  - p. 165313 , 2024
Link: https://doi.org/10.1016/..
 
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9

Impact of SiC power MOSFET interface trap charges on UIS re..:

Wu, Xiao-Dong ; Wang, Ying ; Yu, Cheng-Hao...
Microelectronics Reliability.  155 (2024)  - p. 115375 , 2024
Link: https://doi.org/10.1016/..
 
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10

Analysis of Displacement Damage Induced by Silicon-Ion Irra..:

Wu, Lei ; Dong, Shangli ; Liu, Fengkai...
IEEE Transactions on Nuclear Science.  , 2024
Link: https://doi.org/10.1109/..
 
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11

Effect of Hydrogen Molecule Release on NBTI by Low-Temperat..:

Liu, Fengkai ; Zhu, Cuancuan ; Liu, Zhongli...
IEEE Transactions on Device and Materials Reliability.  24 (2024)  2 - p. 211-218 , 2024
Link: https://doi.org/10.1109/..
 
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12

Response Mechanisms of Additional Displacement Defects in O..:

Guan, Enhao ; Liu, Zhongli ; Ying, Tao...
IEEE Transactions on Nuclear Science.  70 (2023)  5 - p. 768-773 , 2023
Link: https://doi.org/10.1109/..
 
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13

The Influence of Deep-Level Defects With Various Depths in ..:

Guan, Enhao ; Jiang, Hao ; Hou, Shuhao...
IEEE Transactions on Nuclear Science.  70 (2023)  3 - p. 222-227 , 2023
Link: https://doi.org/10.1109/..
 
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14

Unveiling the Linear Photogalvanic Effect in a Two-Dimensio..:

Kaner, Ngeywo Tolbert ; Wei, Yadong ; Fu, BoYang...
ACS Applied Energy Materials.  6 (2023)  10 - p. 5135-5143 , 2023
Link: https://doi.org/10.1021/..
 
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15

Defect Engineering of MoS2 Nanosheets by Heavy-Ion Irradiat..:

Dong, Lei ; Yang, Jianqun ; Yue, Xiaoqing...
ACS Applied Nano Materials.  6 (2023)  20 - p. 18858-18868 , 2023
Link: https://doi.org/10.1021/..
 
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