Yang, Kai-Ruei
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9

A Nonvolatile Ternary-Content-Addressable- Memory Comprisin..:

Hsieh, E. Ray ; Hsueh, Yu Lian ; Lin, Rui Qi...
IEEE Electron Device Letters.  44 (2023)  8 - p. 1292-1295 , 2023
 
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14

Automatic Test Program Generation for Transition Delay Faul..:

, In: 2021 IEEE International Test Conference in Asia (ITC-Asia),
 
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