Yang, Tae Jun
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3

Analysis of Drain-Induced Barrier Lowering in InGaZnO Thin-..:

Yang, Tae Jun ; Kim, Je-Hyuk ; Ryoo, Chang II...
IEEE Transactions on Electron Devices.  70 (2023)  1 - p. 121-126 , 2023
 
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4

P‐30: Thermally Activated and Field‐Enhanced Diffusion of D..:

Ryoo, Chang Il ; Yang, Tae Jun ; Lee, Hee Jun...
SID Symposium Digest of Technical Papers.  53 (2022)  1 - p. 1149-1152 , 2022
 
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10

Physics-Based Compact Model of Current Stress-Induced Thres..:

Yang, Tae Jun ; Park, Jingyu ; Choi, Sungju...
IEEE Electron Device Letters.  43 (2022)  10 - p. 1685-1688 , 2022
 
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