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Yaung, Dun-Nian
7
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1
A Modular, Direct Time-of-Flight Depth Sensor in 45/65-nm 3..:
Ronchini Ximenes, Augusto
;
Padmanabhan, Preethi
;
Lee, Myung-Jae
...
IEEE Journal of Solid-State Circuits. 54 (2019) 11 - p. 3203-3214 , 2019
Link:
https://doi.org/10.1109/..
?
2
[Papers] Quantum Efficiency Simulation and Electrical Cross..:
Yamashita, Yuichiro
;
Minamitani, Natsumi
;
Uchiyama, Masayuki
..
ITE Transactions on Media Technology and Applications. 6 (2018) 3 - p. 180-186 , 2018
Link:
https://doi.org/10.3169/..
?
3
A novel programming technique for highly scalable and distu..:
Huang, Kuo-Ching
;
Fang, Yean-Kuen
;
Yaung, Dun-Nian
...
Solid-State Electronics. 45 (2001) 2 - p. 297-301 , 2001
Link:
https://doi.org/10.1016/..
?
4
A Comparison of Behaviors between Hydrogenated/Unhydrogenat..:
Yaung, Dun-Nian
;
Fang, Yean-Kuen
;
Lee, Kan-Yuan
...
Japanese Journal of Applied Physics. 39 (2000) 7R - p. 3896 , 2000
Link:
https://doi.org/10.1143/..
?
5
Effects of Tungsten Polycide Process and Post-Polyoxidation..:
Huang, Kuo-Ching
;
Fang, Yean-Kuen
;
Yaung, Dun-Nian
..
Japanese Journal of Applied Physics. 38 (1999) 10A - p. L1091 , 1999
Link:
https://doi.org/10.1143/..
?
6
Epitaxial Growth and Electrical Characteristics of β-SiC on..:
Hwang, Jun-Dar
;
Fang, Yean-Kuen
;
Song, You-Joung
.
Japanese Journal of Applied Physics. 34 (1995) 3R - p. 1447 , 1995
Link:
https://doi.org/10.1143/..
?
7
A 45 nm Stacked CMOS Image Sensor Process Technology for Su..:
Takahashi, Seiji
;
Huang, Yi-Min
;
Sze, Jhy-Jyi
...
Sensors. 17 (2017) 12 - p. 2816 , 2017
Link:
https://doi.org/10.3390/..
1-7