Ye, Xuerong
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3

Preconditioning for Accurate Threshold Voltage Extraction o..:

, In: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia),
Chen, Cen ; Wang, Zicheng ; Zhang, Ruyue... - p. 4426-4430 , 2024
 
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4

A Heuristic Robust Design Optimization Approach for Batch P..:

Tan, Jun ; Chen, Hao ; Ye, Xuerong..
IEEE Transactions on Energy Conversion.  39 (2024)  2 - p. 805-816 , 2024
 
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5

Refined Electrical Modelling of Power MOSFETs Based on Phys..:

, In: 2023 5th International Conference on System Reliability and Safety Engineering (SRSE),
Wang, Chenyi ; Chen, Hao ; Wang, Haodong.. - p. 164-169 , 2023
 
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6

Research on the Transfer Learning of MOSFET Physical of Fai..:

, In: 2023 5th International Conference on System Reliability and Safety Engineering (SRSE),
Guo, Zijian ; Ye, Xuerong ; Chen, Hao. - p. 176-180 , 2023
 
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8

Thermal Simulation and Analysis of the SiC MOSFETs Based SS..:

, In: 2023 5th International Conference on System Reliability and Safety Engineering (SRSE),
Wang, Zicheng ; Lai, Yaokang ; Chen, Cen... - p. 44-48 , 2023
 
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9

Reliability Analysis Based on a Bivariate Degradation Model..:

Zheng, Bokai ; Chen, Cen ; Lin, Yigang..
IEEE Transactions on Reliability.  72 (2023)  1 - p. 37-48 , 2023
 
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11

Dictionary Based Three-phase Driver MOSFET Cascading Fault ..:

, In: 2022 13th International Conference on Reliability, Maintainability, and Safety (ICRMS),
Sun, Chengzhi ; Chen, Cen ; Ye, Xuerong.. - p. 275-279 , 2022
 
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12

Model‐based quality consistency analysis of permanent magne..:

Chen, Cen ; Sun, Chengzhi ; Wu, Liqin..
Quality and Reliability Engineering International.  39 (2022)  8 - p. 3502-3517 , 2022
 
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14

Prediction Simulation Method for Analog/Mixed Signal Electr..:

, In: 2022 Global Reliability and Prognostics and Health Management (PHM-Yantai),
Jiang, Weijun ; Ye, Xuerong ; Sun, Qisen.. - p. 1-6 , 2022
 
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15

Life prediction of lithium thionyl chloride batteries based..:

Ye, Xuerong ; Sun, Qisen ; Li, Wenwen.
Quality and Reliability Engineering International.  39 (2022)  8 - p. 3335-3349 , 2022
 
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