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Yeon, Han-Wool
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1

Thermally Stable Amorphous Oxide-based Schottky Diodes thro..:

Lim, Seung-Min ; Yeon, Han-Wool ; Lee, Gi-Baek...
Scientific Reports.  9 (2019)  1 - p. , 2019
Link: https://doi.org/10.1038/..
 
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2

Electromigration behavior of advanced metallization on the ..:

Jang, Kyung-Tae ; Park, Yong-Jin ; Jeong, Min-Woo...
Microelectronic Engineering.  156 (2016)  - p. 97-102 , 2016
Link: https://doi.org/10.1016/..
 
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3

Structural-relaxation-driven electron doping of amorphous o..:

Yeon, Han-Wool ; Lim, Seung-Min ; Jung, Jung-Kyu...
NPG Asia Materials.  8 (2016)  3 - p. e250-e250 , 2016
Link: https://doi.org/10.1038/..
 
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4

Improvements of mechanical fatigue reliability of Cu interc..:

Lee, Young-Joo ; Shin, Hae-A-Seul ; Nam, Dae-Hyun...
Electronic Materials Letters.  11 (2015)  1 - p. 149-154 , 2015
Link: https://doi.org/10.1007/..
 
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5

One-step structure modulation of electrospun metal-loaded c..:

Nam, Dae-Hyun ; Lee, Ji-Hoon ; Kim, Na-Rae...
Carbon.  82 (2015)  - p. 273-281 , 2015
Link: https://doi.org/10.1016/..
 
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6

Effect of pulsed electric fields on dielectric breakdown in..:

Yeon, Han-Wool ; Song, Jun-Young ; Lim, Seung-Min...
Applied Physics Express.  8 (2015)  3 - p. 031502 , 2015
Link: https://doi.org/10.7567/..
 
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7

Graphene as an atomically thin barrier to Cu diffusion into..:

Hong, Juree ; Lee, Sanggeun ; Lee, Seulah...
Nanoscale.  6 (2014)  13 - p. 7503-7511 , 2014
Link: https://doi.org/10.1039/..
 
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8

Effects of film thickness and deposition rate on the diffus..:

Lee, Young-Joo ; Yeon, Han-Wool ; Jung, Sung-Yup...
Electronic Materials Letters.  10 (2014)  1 - p. 275-279 , 2014
Link: https://doi.org/10.1007/..
 
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9

Influences of semiconductor morphology on the mechanical fa..:

Lee, Young-Joo ; Uk Lee, Yong ; Yeon, Han-Wool...
Applied Physics Letters.  103 (2013)  24 - p. , 2013
Link: https://doi.org/10.1063/..
 
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10

Enhanced conductivity of solution-processed indium tin oxid..:

Kim, Na-Rae ; Lee, Ji-Hoon ; Lee, Yoo-Yong...
Journal of Materials Chemistry C.  1 (2013)  37 - p. 5953 , 2013
Link: https://doi.org/10.1039/..
 
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11

Cu Contamination of the nMOSFET in a 3-D Integrated Circuit..:

Yeon, Han-Wool ; Jung, Sung-Yup ; Lim, Jung-ryul...
Electrochemical and Solid-State Letters.  15 (2012)  5 - p. H157 , 2012
Link: https://doi.org/10.1149/..
 
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12

Erratum: "Effects of Metal Electrode on the Electrical Perf..:

Yim, Jung-Ryoul ; Jung, Sung-Yup ; Yeon, Han-Wool...
Japanese Journal of Applied Physics.  51 (2012)  2R - p. 029201 , 2012
Link: https://doi.org/10.7567/..
 
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13

Erratum: "Effects of Metal Electrode on the Electrical Perf..:

Yim, Jung-Ryoul ; Jung, Sung-Yup ; Yeon, Han-Wool...
Japanese Journal of Applied Physics.  51 (2012)  2R - p. 029201 , 2012
Link: https://doi.org/10.1143/..
 
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14

Effects of Metal Electrode on the Electrical Performance of..:

Yim, Jung-Ryoul ; Jung, Sung-Yup ; Yeon, Han-Wool...
Japanese Journal of Applied Physics.  51 (2012)  1R - p. 011401 , 2012
Link: https://doi.org/10.7567/..
 
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15

Effects of Metal Electrode on the Electrical Performance of..:

Yim, Jung-Ryoul ; Jung, Sung-Yup ; Yeon, Han-Wool...
Japanese Journal of Applied Physics.  51 (2011)  1R - p. 011401 , 2011
Link: https://doi.org/10.1143/..
 
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