Yi-Ting Chang
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1

Effect of embedded beads distribution on cellular traction ..:

Yi-Ting, Chang ; Hung-Huei, Lee ; Hsuan, Yang..
Frontiers in Bioengineering and Biotechnology.  4 (2016)  - p. , 2016
 
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2

Investigation of IGZO Thin Film Transistors with Copper Ele..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Lee, Po-Yi ; Zhou, Kuan-Ju ; Chen, Yu-An.. - p. 1-2 , 2024
 
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3

The Characteristics and Reliability With Channel Length Dep..:

Kuo, Chuan-Wei ; Tsai, Tsung-Ming ; Chang, Ting-Chang...
IEEE Transactions on Device and Materials Reliability.  24 (2024)  2 - p. 268-274 , 2024
 
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5

Abnormal Degradation Behaviors Under Negative Bias Stress i..:

Wu, Chia-Chuan ; Ma, William Cheng-Yu ; Chang, Ting-Chang...
IEEE Transactions on Electron Devices.  70 (2023)  3 - p. 1079-1084 , 2023
 
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6

Peritoneal Fluid Analysis of Advanced Ovarian Cancers after..:

Chen, Wei-Chun ; Chang, Ting-Chang ; Chou, Hung-Hsueh...
International Journal of Molecular Sciences.  24 (2023)  11 - p. 9748 , 2023
 
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7

Investigating the Relationship Between Kink Voltage and Wid..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
Wu, Yi-Zhen ; Jin, Fu-Yuan ; Kuo, Ting-Tzu.. - p. 1-2 , 2023
 
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9

Investigation of Hydrogen Diffusion in Top Gate IGZO TFTs b..:

, In: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT),
 
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10

Study on Memristor-Based 3-D Convolutional Neural Network A..:

Dong, Boyi ; Li, Peixuan ; Fu, Yaoyao...
IEEE Transactions on Electron Devices.  70 (2023)  3 - p. 993-1000 , 2023
 
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13

Investigating two-stage degradation of threshold voltage in..:

Lin, Yu-Shan ; Chen, Yi-Lin ; Chang, Ting-Chang...
Semiconductor Science and Technology.  37 (2022)  2 - p. 025017 , 2022
 
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14

Improving Reliability of a-InGaZnO TFTs With Optimal Locati..:

Tu, Yu-Fa ; Chiang, Cheng-Ling ; Chang, Ting-Chang...
IEEE Transactions on Electron Devices.  69 (2022)  6 - p. 3181-3185 , 2022
 
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15

Investigation of Electrical Characteristics in Low-Temperat..:

, In: 2022 IET International Conference on Engineering Technologies and Applications (IET-ICETA),
 
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